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Cornell University

Energy Research Lab

Advanced Metrology

Probing sciences at the extreme time and length scales

We create new metrology tools to probe energy conversion and transport at extreme time and length scales. With high-resolution and high-sensitivity electron microscopy, optical spectroscopy, and quantum metrology, we are directly imaging dynamics of single molecules, probing vibration of atoms, measuring heat and mass transfer across liquid-gas interfaces, and detecting thermal-electrical-magnetic-mechanical interaction at micro-nanoscale, providing new insights into the key physical phenomena associated with clean water supply, renewable energy production, and electronic cooling.

Imaging interaction of single molecules

We are using in situ electron microscope to directly image the adsorption of single gas molecules into nanoporous sorbent materials for a variety of applications relevant to energy storage, carbon capture, and clean water production.

Probing vibration of atoms

We are adopting advanced laser spectroscopy to enable the direct probe of atomic vibration, unraveling how materials expand in electronics, how heat flows through two atomic layers, and how water molecules are emitted from liquid interface.

Related Publications

  1. L. Zhang, Y. Zhong, X. Li, J.-H. Park, Q. Song, L. Li, L. Guo, J. Kong, and G. Chen, Effect of Twist Angle on Interfacial Thermal Transport in Two-Dimensional Bilayers, Nano Letters, 23, 17, 7790–7796 (2023)

  2. Y. Zhong, L. Zhang, J.-H. Park, S. Cruz, L. Li, L. Guo, J. Kong, and E.N. Wang, A unified approach and descriptor for the thermal expansion of two-dimensional transition metal dichalcogenide monolayers, Science Advances, 8, 46, eabo3783 (2022)

  3. L. Zhang, Z. Lu, Y. Song, L. Zhao, B. Bhatia, K.R. Bagnall, and E.N. Wang, Thermal expansion coefficient of monolayer molybdenum disulfide using micro-Raman spectroscopy, Nano Letters, 19, 7, 4745-4751 (2019)

 

Multi-physics interaction in electronic devices

We are leveraging the ultrahigh sensitivity of quantum phenomena during light-matter interaction to simultaneously detect temperature rise, electric field, magnetic field, and mechanical stress in electronic devices, providing useful insights into efficient thermal management.

 

Related Publications

  1. C. Foy, L. Zhang, M.E. Trusheim, K.R. Bagnall, M. Walsh, E.N. Wang, and D. Englund, Wide-field magnetic field and temperature imaging using nanoscale quantum sensors, ACS Applied Materials & Interfaces, 12, 23, 26525-26533 (2020)

  2. K.R. Bagnall, E.A. Moore, S.C. Badescu, L. Zhang, E.N. Wang, Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy, Review of Scientific Instruments, 88, 113111 (2017)