Platform for the Accelerated Realization, Analysis, & Discovery of Interface Materials

Characterization

The following electron microscopy resources are available at Cornell to PARADIM users through partnership with the Cornell Center for Materials Science.

• FEI F20 Tecnai TEM STEM: The F20 is a 200 kV field emission transmission electron microscope with monochromator with 1 Å resolution in TEM and 1.4 Å in STEM.
• FEI Strata 400 STEM FIB: The Strata 400 is a DualBeam ™ system for high-resolution, high-contrast imaging and specimen preparation. It incorporates a field emission scanning electron microscope column and a focused ion beam column.
• FEI T12 Spirit TEM STEM: The T12 Spirit is a 120 kV field emission transmission electron microscope used to analyze both inorganic and organic materials at the nanoscale. Similar to the 200kV Tecnai, this instrument has the ability to do electron tomography and diffraction analysis. The T12 is also equipped with a EDAX Genesis X-ray detector, so elemental analysis is also one of its capabilities.
• FEI Tecnai 12 Bio-Twin TEM: The Bio-Twin TEM offers high performance, versatility, high productivity and ease of operation. It is typically operated at 80 KV and 120kV The fully motorized eucentric goniometer stage (CompuStage®) can be tilted to ±80°. It is equipped with a high-resolution, high-contrast, thermoelectrically (TE) cooled Gatan Orius® 1000 dual-scan CCD camera
• JEOL 8900 Microprobe: The JEOL Microprobe is used for quantitative elemental analysis of samples on a micron scale. There are 5 wavelength dispersive X-ray spectrometers (WDS), an energy dispersive X-ray detector (EDS). The scanning system forms images from secondary and backscattered electrons, and maps from X-rays.
• NION UltraSTEM 100: The SuperSTEM has a spherical aberration corrector integrated into its column, which nulls all axial aberrations up to fifth order. As a result, an angstrom-scale probe with 0.1 nA of current enables imaging with angstrom-level (0.1 nm) resolution. The electron optics can be quickly changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes (electron energy loss spectroscopy).
• FEI Titan Themis 300: The FEI Titan TEM/STEM operates at 60, 120 and 300 keV. It is equipped with a spherical aberration corrector for the probe-forming lens which enables sub-Ångstrom resolution in STEM. A monochromator, high-brightness gun (X-FEG) and high-resolution spectrometer (GIF Quantum 965) with dual EELS capability allow rapid spectroscopic mapping and gives access to both light and heavy elements simultaneously. The instrument is equipped with a Lorentz lens for magnetic imaging and a cryo-box for imaging and spectroscopy at cryogenic temperatures.
• LEO 1550 FESEM: The LEO 1550 (Keck SEM) offers SEM imaging at very high resolution; 1 nm at 20 KeV and 2.5 nm at 5 KeV resolution is possible with certain types of specimens. It has superb performance at low accelerating voltages (i.e. 0.5 to 3 KV). An in-lens secondary electron detector enables a very short working distance and responds to the lowest voltage secondary electrons. Transmission Electron Imaging TEM grids may be used in a special stage in conjunction with a detector below the specimen to obtain transmitted electron images.
• Tescan Mira3 FESEM: The Mira 3 is a very high resolution field emission scanning electron Imaging at very high resolution (1 nm at 30 KeV and 2 nm at 1 KeV) is possible with certain types of specimens. It ha s superb performance, particularly at low accelerating voltages (i.e. 0.2 to 1 KV using Beam Deceleration Mode).
• B-nano airSEM: The airSEM allows for high throughput, in-air imaging of specimens at nanoscale resolution. Based on a field emission SEM operating from 5 to 30 keV, the vacuum chamber of the electron column is separated from the specimen chamber by an electron-transparent window, enabling imaging in ambient conditions. The instrument is equipped with an EDX detector for elemental analysis.

In addition extensive sample preparation resources are available.

A Protochips Aduro Double Tilt Heating/Electrical Holder and a Gatan 636 Double Tilt Liquid Nitrogen Holder are also available for atomic resolution imaging while heating and biasing or cooling. Both are compatible with all FEI (S)TEMs.